The 14th IEEE SMART-2025 conference in Moradabad showcased global innovations in AI, Industry 4.0, and system modelling, ...

Traditional semiconductor testing typically involves tests executed by automatic test equipment (ATE). But engineers are beginning to favor an additional late-test pass that tests systems-on-chip ...

Atego Vantage combines model-based systems and software engineering, asset-based modular design and product line variation to provide model-based product line engineering, with a claimed 62% reduction ...