(Nanowerk News) Computers were integrated into Industry 3.0 to reduce the use of manual labour. Industry 4.0 represents the next stage in this process. The focus is now on boosting the levels of ...

The multilayer system used in lithography consists of a planarizing carbon layer beneath a hardmask etch-transferring layer and capped with a standard photoresist coating. In the past, Brewer Science ...

KARACHI: Indus Motor Company (IMC) has achieved a prestigious milestone by receiving “Zero Defect” status from Toyota Motor ...

Production delays and quality errors are a universal challenge in manufacturing. In Aerospace and defense (A&D), however, the stakes are especially high. An equipment failure or out-of-tolerance ...

Read more about meeting the individual challenges of digital zero-defect testing and details of approaches to dealing with these challenges. The effectiveness of semiconductor manufacturing test has a ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...