At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Foundries and packaging houses are wrestling how to control heat in the testing phase, particularly as devices continue to shrink and as thermally sensitive analog circuits are added into SoCs and ...

Testing verifies that protection schemes meet their intended purpose, ensuring safety and system integrity. Function testing involves manual or electrical manipulation of components to confirm signal ...

Plaintiff SEMICAPS filed suit in the Northern District of California, alleging infringement of U.S. Patent No. 7,623,982, which relates to the testing of electronic circuits using a laser. The ...

When testing circuits with a logic probe, it is sometimes difficult to watch the LEDS on the probe to determine the logic state. With this probe the logic states are audible. This probe is designed ...