Environmental Scanning Electron Microscopy (ESEM) represents a significant evolution of conventional scanning electron microscopy. By utilising variable pressure conditions rather than the high vacuum ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

东京--(BUSINESS WIRE)--(美国商业资讯)-- JEOL Ltd.（TOKYO：6951）（总裁兼首席执行官：Izumi Oi）宣布将于2024年7月28日发布新款Schottky Field Emission Scanning Electron Microscope JSM-IT810。 场发射扫描电子显微镜（FESEM）广泛应用于科研机构、大学和工业等科技领域。人们越来越 ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...