Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

Provide practical KPIs to monitor, including FA hit rate (percent of FAs that find root cause) and time to address yield ...

If there's a truism in design debug and test, it's that the earlier you can find a bug, the less costly it is to fix. Thus, finding bugs at RTL is far preferable to finding them after synthesis. With ...

PORTLAND, Maine, Dec. 18, 2025 /PRNewswire/ -- The Council on International Educational Exchange (CIEE) and the Scan Design Foundation (SDF) are pleased to announce the inaugural cohort selected for ...

"Scan chains provide a window into the chip." - Yervant Zorian, CTO of Virage Logic. "It's well known that scan chains are a major source of vulnerability in embedded systems." - Srinivas Ravi, ...