A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Scanning probe lithography (SPL) represents a rapidly evolving class of nanofabrication techniques that utilise the precision of scanning probe microscopy to directly manipulate material surfaces at ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

Lithium ion batteries dominate the energy storage sector from the scale of small portable devices to electric vehicles and even grid-scale electricity suppliers. Research is constantly ongoing to ...

The work was supported by the World Premier International Research Center Initiative (WPI), MEXT, Japan, JSPS Grants-in-Aid for Scientific Research (21H01770, 22K04890). The principle of scanning ion ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

(Nanowerk News) Semiconductors are foundational components of modern energy, communication, and myriad other technologies. Research on tailoring the underlying nanostructure of semiconductors for ...

Capturing up to 50,000 points/s, the SLP-330 is a fast laser scanning probe mounted on an articulated arm. The SLP-330 is able to scan parts with dimensions as long as 12 ft without having to move the ...

A new technical paper titled “Externally-triggerable optical pump-probe scanning tunneling microscopy with a time resolution of tens-picosecond” was published by researchers at University of Tsukuba ...