IC manufacturers are increasingly relying on intelligent data processing to prevent downtime, improve yields, and reduce scrap. They are integrating that with fault detection and classification (FDC) ...
IIIF provides researchers rich metadata and media viewing options for comparison of works across cultural heritage collections. Visit the IIIF page to learn more. In September of 1939, President ...
Dr. James McCaffrey from Microsoft Research presents a full-code, step-by-step tutorial on using the LightGBM tree-based system to perform binary classification (predicting a discrete variable that ...
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